|
| Titre : |
Practical electron microscopy of lattice defects |
| Type de document : |
document électronique |
| Auteurs : |
Hiroyasu Saka, Auteur |
| Editeur : |
New Jersey : World Scientific |
| Année de publication : |
2021 |
| Importance : |
294 p. |
| Présentation : |
ill |
| Format : |
1 ressource en ligne |
| Accompagnement : |
CD |
| ISBN/ISSN/EAN : |
978-981-1234699-- |
| Langues : |
Anglais (eng) |
| Catégories : |
E-Books
|
| Tags : |
Crystal lattices--Defects Transmission electron microscopes |
| Index. décimale : |
621.31 Production, transformation, accumulation, transport d'énergie électrique |
| Résumé : |
This unique reference text provides those who are studying crystal lattice defects using a transmission electron microscope (TEM) with a basic knowledge of transmission electron microscopy. As it has been written for beginners, the principles of both transmission electron microscopy and crystallography have been clearly and simply explained, with the use of many figures and photographs to aid understanding. Mathematics is avoided where possible, and problems and exercises are amply provided. |
| En ligne : |
https://doi.org/10.1142/12221 |
Practical electron microscopy of lattice defects [document électronique] / Hiroyasu Saka, Auteur . - New Jersey : World Scientific, 2021 . - 294 p. : ill ; 1 ressource en ligne + CD. ISBN : 978-981-1234699-- Langues : Anglais ( eng)
| Catégories : |
E-Books
|
| Tags : |
Crystal lattices--Defects Transmission electron microscopes |
| Index. décimale : |
621.31 Production, transformation, accumulation, transport d'énergie électrique |
| Résumé : |
This unique reference text provides those who are studying crystal lattice defects using a transmission electron microscope (TEM) with a basic knowledge of transmission electron microscopy. As it has been written for beginners, the principles of both transmission electron microscopy and crystallography have been clearly and simply explained, with the use of many figures and photographs to aid understanding. Mathematics is avoided where possible, and problems and exercises are amply provided. |
| En ligne : |
https://doi.org/10.1142/12221 |
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Practical electron microscopy of lattice defects
