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Titre : Transmission electron microscopy : part 2, diffraction Type de document : texte imprimé Auteurs : David B. Williams ; C. Barry Carter Mention d'édition : 2nd edition Editeur : New York : Springer Année de publication : 2009 Importance : 1 vol. (LXII p.-p. 197-368-15 p.) Présentation : ill. en noir et en coul., couv. ill. en coul Format : 28 cm Note générale : Index Langues : Anglais (eng) Catégories : Livres Tags : Matériaux - Microscopie Microscopie électronique transmission Index. décimale : 620.11 Matériaux de l'ingénieur Résumé : This groundbreaking text has been established as the market leader throughout the world. Profusely illustrated, Transmission Electron Microscopy: A Textbook for Materials Science provides the necessary instructions for successful hands-on application of this versatile materials characterization technique. For this first new edition in 12 years, many sections have been completely rewritten with all others revised and updated. The new edition also includes an extensive collection of questions for the student, providing approximately 800 self-assessment questions and over 400 questions that are suitable for homework assignment. Four-color illustrations throughout also enhance the new edition. Praise for the first edition: `The best textbook for this audience available.' – American Scientist. `Ideally suited to the needs of a graduate level course. It is hard to imagine this book not fulfilling most of the requirements of a text for such a course.' – Microscope. `This book is written in such a comprehensive manner that it is understandable to all people who are trained in physical science and it will be useful both for the expert as well as the student.' – Micron. `The book answers nearly any question - be it instrumental, practical, or theoretical - either directly or with an appropriate reference...This book provides a basic, clear-cut presentation of how transmission electron microscopes should be used and of how this depends specifically on one's specific undergoing project.' – MRS Bulletin, May 1998. `The only complete text now available which includes all the remarkable advances made in the field of TEM in the past 30-40 years....The authors can be proud of an enormous task, very well done.' – from the Foreword by Professor Gareth Thomas, University of California, Berkeley Transmission electron microscopy : part 2, diffraction [texte imprimé] / David B. Williams ; C. Barry Carter . - 2nd edition . - New York : Springer, 2009 . - 1 vol. (LXII p.-p. 197-368-15 p.) : ill. en noir et en coul., couv. ill. en coul ; 28 cm.
Index
Langues : Anglais (eng)
Catégories : Livres Tags : Matériaux - Microscopie Microscopie électronique transmission Index. décimale : 620.11 Matériaux de l'ingénieur Résumé : This groundbreaking text has been established as the market leader throughout the world. Profusely illustrated, Transmission Electron Microscopy: A Textbook for Materials Science provides the necessary instructions for successful hands-on application of this versatile materials characterization technique. For this first new edition in 12 years, many sections have been completely rewritten with all others revised and updated. The new edition also includes an extensive collection of questions for the student, providing approximately 800 self-assessment questions and over 400 questions that are suitable for homework assignment. Four-color illustrations throughout also enhance the new edition. Praise for the first edition: `The best textbook for this audience available.' – American Scientist. `Ideally suited to the needs of a graduate level course. It is hard to imagine this book not fulfilling most of the requirements of a text for such a course.' – Microscope. `This book is written in such a comprehensive manner that it is understandable to all people who are trained in physical science and it will be useful both for the expert as well as the student.' – Micron. `The book answers nearly any question - be it instrumental, practical, or theoretical - either directly or with an appropriate reference...This book provides a basic, clear-cut presentation of how transmission electron microscopes should be used and of how this depends specifically on one's specific undergoing project.' – MRS Bulletin, May 1998. `The only complete text now available which includes all the remarkable advances made in the field of TEM in the past 30-40 years....The authors can be proud of an enormous task, very well done.' – from the Foreword by Professor Gareth Thomas, University of California, Berkeley Réservation
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Titre : Transmission electron microscopy : part 3, imaging Type de document : texte imprimé Auteurs : David B. Williams ; C. Barry Carter Mention d'édition : 2nd edition Editeur : New York : Springer Année de publication : 2009 Importance : 1 vol. (LXII p.-p. 371-578-15 p.) Présentation : ill. en noir et en coul., couv. ill. en coul Format : 28 cm Note générale : Index Langues : Anglais (eng) Catégories : Livres Tags : Matériaux - Microscopie Microscopie électronique transmission Index. décimale : 620.11 Matériaux de l'ingénieur Résumé : This groundbreaking text has been established as the market leader throughout the world. Profusely illustrated, Transmission Electron Microscopy: A Textbook for Materials Science provides the necessary instructions for successful hands-on application of this versatile materials characterization technique. For this first new edition in 12 years, many sections have been completely rewritten with all others revised and updated. The new edition also includes an extensive collection of questions for the student, providing approximately 800 self-assessment questions and over 400 questions that are suitable for homework assignment. Four-color illustrations throughout also enhance the new edition. Praise for the first edition: `The best textbook for this audience available.' – American Scientist. `Ideally suited to the needs of a graduate level course. It is hard to imagine this book not fulfilling most of the requirements of a text for such a course.' – Microscope. `This book is written in such a comprehensive manner that it is understandable to all people who are trained in physical science and it will be useful both for the expert as well as the student.' – Micron. `The book answers nearly any question - be it instrumental, practical, or theoretical - either directly or with an appropriate reference...This book provides a basic, clear-cut presentation of how transmission electron microscopes should be used and of how this depends specifically on one's specific undergoing project.' – MRS Bulletin, May 1998. `The only complete text now available which includes all the remarkable advances made in the field of TEM in the past 30-40 years....The authors can be proud of an enormous task, very well done.' – from the Foreword by Professor Gareth Thomas, University of California, Berkeley
Transmission electron microscopy : part 3, imaging [texte imprimé] / David B. Williams ; C. Barry Carter . - 2nd edition . - New York : Springer, 2009 . - 1 vol. (LXII p.-p. 371-578-15 p.) : ill. en noir et en coul., couv. ill. en coul ; 28 cm.
Index
Langues : Anglais (eng)
Catégories : Livres Tags : Matériaux - Microscopie Microscopie électronique transmission Index. décimale : 620.11 Matériaux de l'ingénieur Résumé : This groundbreaking text has been established as the market leader throughout the world. Profusely illustrated, Transmission Electron Microscopy: A Textbook for Materials Science provides the necessary instructions for successful hands-on application of this versatile materials characterization technique. For this first new edition in 12 years, many sections have been completely rewritten with all others revised and updated. The new edition also includes an extensive collection of questions for the student, providing approximately 800 self-assessment questions and over 400 questions that are suitable for homework assignment. Four-color illustrations throughout also enhance the new edition. Praise for the first edition: `The best textbook for this audience available.' – American Scientist. `Ideally suited to the needs of a graduate level course. It is hard to imagine this book not fulfilling most of the requirements of a text for such a course.' – Microscope. `This book is written in such a comprehensive manner that it is understandable to all people who are trained in physical science and it will be useful both for the expert as well as the student.' – Micron. `The book answers nearly any question - be it instrumental, practical, or theoretical - either directly or with an appropriate reference...This book provides a basic, clear-cut presentation of how transmission electron microscopes should be used and of how this depends specifically on one's specific undergoing project.' – MRS Bulletin, May 1998. `The only complete text now available which includes all the remarkable advances made in the field of TEM in the past 30-40 years....The authors can be proud of an enormous task, very well done.' – from the Foreword by Professor Gareth Thomas, University of California, Berkeley
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Titre : Transmission electron microscopy : part 4, spectrometry Type de document : texte imprimé Auteurs : David B. Williams ; C. Barry Carter Mention d'édition : 2nd edition Editeur : New York : Springer Année de publication : 2009 Importance : 1 vol. (LXII p.-p. 581-760-15 p.) Présentation : ill. en noir et en coul., couv. ill. en coul Format : 28 cm Note générale : Index Langues : Anglais (eng) Catégories : Livres Tags : Matériaux - Microscopie Microscopie électronique transmission Index. décimale : 620.11 Matériaux de l'ingénieur Résumé : This groundbreaking text has been established as the market leader throughout the world. Profusely illustrated, Transmission Electron Microscopy: A Textbook for Materials Science provides the necessary instructions for successful hands-on application of this versatile materials characterization technique. For this first new edition in 12 years, many sections have been completely rewritten with all others revised and updated. The new edition also includes an extensive collection of questions for the student, providing approximately 800 self-assessment questions and over 400 questions that are suitable for homework assignment. Four-color illustrations throughout also enhance the new edition. Praise for the first edition: `The best textbook for this audience available.' – American Scientist. `Ideally suited to the needs of a graduate level course. It is hard to imagine this book not fulfilling most of the requirements of a text for such a course.' – Microscope. `This book is written in such a comprehensive manner that it is understandable to all people who are trained in physical science and it will be useful both for the expert as well as the student.' – Micron. `The book answers nearly any question - be it instrumental, practical, or theoretical - either directly or with an appropriate reference...This book provides a basic, clear-cut presentation of how transmission electron microscopes should be used and of how this depends specifically on one's specific undergoing project.' – MRS Bulletin, May 1998. `The only complete text now available which includes all the remarkable advances made in the field of TEM in the past 30-40 years....The authors can be proud of an enormous task, very well done.' – from the Foreword by Professor Gareth Thomas, University of California, Berkeley Transmission electron microscopy : part 4, spectrometry [texte imprimé] / David B. Williams ; C. Barry Carter . - 2nd edition . - New York : Springer, 2009 . - 1 vol. (LXII p.-p. 581-760-15 p.) : ill. en noir et en coul., couv. ill. en coul ; 28 cm.
Index
Langues : Anglais (eng)
Catégories : Livres Tags : Matériaux - Microscopie Microscopie électronique transmission Index. décimale : 620.11 Matériaux de l'ingénieur Résumé : This groundbreaking text has been established as the market leader throughout the world. Profusely illustrated, Transmission Electron Microscopy: A Textbook for Materials Science provides the necessary instructions for successful hands-on application of this versatile materials characterization technique. For this first new edition in 12 years, many sections have been completely rewritten with all others revised and updated. The new edition also includes an extensive collection of questions for the student, providing approximately 800 self-assessment questions and over 400 questions that are suitable for homework assignment. Four-color illustrations throughout also enhance the new edition. Praise for the first edition: `The best textbook for this audience available.' – American Scientist. `Ideally suited to the needs of a graduate level course. It is hard to imagine this book not fulfilling most of the requirements of a text for such a course.' – Microscope. `This book is written in such a comprehensive manner that it is understandable to all people who are trained in physical science and it will be useful both for the expert as well as the student.' – Micron. `The book answers nearly any question - be it instrumental, practical, or theoretical - either directly or with an appropriate reference...This book provides a basic, clear-cut presentation of how transmission electron microscopes should be used and of how this depends specifically on one's specific undergoing project.' – MRS Bulletin, May 1998. `The only complete text now available which includes all the remarkable advances made in the field of TEM in the past 30-40 years....The authors can be proud of an enormous task, very well done.' – from the Foreword by Professor Gareth Thomas, University of California, Berkeley Réservation
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Exemplaires (2)
Code-barres Cote Support Localisation Section Disponibilité C1-00244/11 620.11 WIL C1 Livre 2ème Cycle.(Salle 3ème Étage) Ingénierie et activités connexes Exclu du prêt C2-00250/11 620.11 WIL C2 Livre 2ème Cycle.(Salle 3ème Étage) Ingénierie et activités connexes Disponible
Titre : Transmission electron microscopy : part1, basics Type de document : texte imprimé Auteurs : David B. Williams ; C. Barry Carter Mention d'édition : 2nd edition Editeur : New York : Springer Année de publication : 2009 Importance : 1 vol. (LXII p.-p. 3-193-15 p.) Présentation : ill. en noir et en coul., couv. ill. en coul Format : 28 cm Note générale : Index Langues : Anglais (eng) Catégories : Livres Tags : Matériaux - Microscopie Microscopie électronique transmission Index. décimale : 620.11 Matériaux de l'ingénieur Résumé : Résumé: This groundbreaking text has been established as the market leader throughout the world. Profusely illustrated, Transmission Electron Microscopy: A Textbook for Materials Science provides the necessary instructions for successful hands-on application of this versatile materials characterization technique. For this first new edition in 12 years, many sections have been completely rewritten with all others revised and updated. The new edition also includes an extensive collection of questions for the student, providing approximately 800 self-assessment questions and over 400 questions that are suitable for homework assignment. Four-color illustrations throughout also enhance the new edition. Praise for the first edition: `The best textbook for this audience available.' – American Scientist. `Ideally suited to the needs of a graduate level course. It is hard to imagine this book not fulfilling most of the requirements of a text for such a course.' – Microscope. `This book is written in such a comprehensive manner that it is understandable to all people who are trained in physical science and it will be useful both for the expert as well as the student.' – Micron. `The book answers nearly any question - be it instrumental, practical, or theoretical - either directly or with an appropriate reference...This book provides a basic, clear-cut presentation of how transmission electron microscopes should be used and of how this depends specifically on one's specific undergoing project.' – MRS Bulletin, May 1998. `The only complete text now available which includes all the remarkable advances made in the field of TEM in the past 30-40 years....The authors can be proud of an enormous task, very well done.' – from the Foreword by Professor Gareth Thomas, University of California, Berkeley
Transmission electron microscopy : part1, basics [texte imprimé] / David B. Williams ; C. Barry Carter . - 2nd edition . - New York : Springer, 2009 . - 1 vol. (LXII p.-p. 3-193-15 p.) : ill. en noir et en coul., couv. ill. en coul ; 28 cm.
Index
Langues : Anglais (eng)
Catégories : Livres Tags : Matériaux - Microscopie Microscopie électronique transmission Index. décimale : 620.11 Matériaux de l'ingénieur Résumé : Résumé: This groundbreaking text has been established as the market leader throughout the world. Profusely illustrated, Transmission Electron Microscopy: A Textbook for Materials Science provides the necessary instructions for successful hands-on application of this versatile materials characterization technique. For this first new edition in 12 years, many sections have been completely rewritten with all others revised and updated. The new edition also includes an extensive collection of questions for the student, providing approximately 800 self-assessment questions and over 400 questions that are suitable for homework assignment. Four-color illustrations throughout also enhance the new edition. Praise for the first edition: `The best textbook for this audience available.' – American Scientist. `Ideally suited to the needs of a graduate level course. It is hard to imagine this book not fulfilling most of the requirements of a text for such a course.' – Microscope. `This book is written in such a comprehensive manner that it is understandable to all people who are trained in physical science and it will be useful both for the expert as well as the student.' – Micron. `The book answers nearly any question - be it instrumental, practical, or theoretical - either directly or with an appropriate reference...This book provides a basic, clear-cut presentation of how transmission electron microscopes should be used and of how this depends specifically on one's specific undergoing project.' – MRS Bulletin, May 1998. `The only complete text now available which includes all the remarkable advances made in the field of TEM in the past 30-40 years....The authors can be proud of an enormous task, very well done.' – from the Foreword by Professor Gareth Thomas, University of California, Berkeley
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Code-barres Cote Support Localisation Section Disponibilité C1-00432/11 620.11 WIL C1 Livre 2ème Cycle.(Salle 3ème Étage) Ingénierie et activités connexes Exclu du prêt C2-00479/11 620.11 WIL C2 Livre 2ème Cycle.(Salle 3ème Étage) Ingénierie et activités connexes Disponible
